General Adaptive Neighborhood Image Processing and Analysis (GANIPA) NEW
Instructor: Johan Debayle, MINES Saint-Etienne, LGF CNRS UMR 5307, Centre SPIN
Level: Intermediate
Duration: 4 hours
Course Date/Time: Wednesday 18 January 08:30 - 12:45
Prerequisites: Basic skills in image processing

Benefits:
This course enables the attendee to:

• Understand the difference between linear and nonlinear image processing.
• Learn new methods of nonlinear image processing and analysis.
• Apply new techniques for image filtering, segmentation, analysis, classification, registration.
• Describe the advantages of nonlinear image processing techniques for gray level images.
• Be able to identify challenges for color and multispectral image processing.

Course Description:
This tutorial addresses specific nonlinear image processing and analysis techniques that can be used in several areas: image filtering and segmentation, shape analysis, object recognition, image classification, image registration. In addition, these techniques are demonstrated on real applications in chemical engineering, material engineering, biomedical engineering, and remote sensing. The participants gain techniques as well as coverage of the topic: nonlinear adaptive image processing and analysis.

Intended Audience:
Academia including graduate students, practicing engineers, researchers, and professors

Johan Debayle received his MSc, PhD and Habilitation in the field of image processing and analysis (2002, 2005 and 2012 respectively). Currently, he is a full professor at the Ecole Nationale Supérieure des Mines de Saint-Etienne (MINES Saint-Etienne) in France, within the SPIN Center and the LGF Laboratory, UMR CNRS 5307, where he leads both the PMMG and PMDM departments, respectively, which are interested in image processing and analysis of granular media. He is also the Deputy Director of the MORPHEA CNRS GDR 2021 Research Group. He is the General Chair/Co-Chair of several international conferences (IEEE ISIVC’2020, ECSIA’2021, ICIVP’2021, ICMV’2021, ISIVC’2022, ICPRS’2022). He is associate editor of 6 int. journals (PRL, PAA, JEI, IAS, JoI, IET-IP). His research interests include image processing and analysis, mathematical morphology, pattern recognition, and stochastic geometry. He published more than 150 international papers in book chapters, international journals, and conference proceedings. He has been Invited Professor in different universities: ITWM Fraunhofer / University of Kaisersleutern (Germany), University Gadjah Mada, Yogyakarta (Indonesia), University of Puebla (Mexico) and is currently co-supervisor of several PhD students with these partners. He served as Program committee member in several international conferences (ICPRS, IEEE ICIP, ICMV). He has been invited as keynote speaker in several international conferences (ICPRS, SPIE EI, ICMV). He is a reviewer for several international journals (PR, PRL, PAA, IEEE-TIP, JMIV). He is Fellow of IET, Fellow of IACSIT, Senior Member of IEEE, Member of the IAPR, and member of the board of directors of AFRIF (IAPR France Section). More information is given on Prof. Johan Debayle’s homepage: http://www.emse.fr/~debayle/

Discounts given for multiple classes. See Registration Page for details to register.

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