IMPORTANT DATES
Dates currently being confirmed; check back.
 

2022
Call for Papers Announced 2 May
Journal-first (JIST/JPI) Submissions

∙ Submission site Opens 2 May 
∙ Journal-first (JIST/JPI) Submissions Due 1 Aug
∙ Final Journal-first manuscripts due 28 Oct
Conference Papers Submissions
∙ Abstract Submission Opens 1 June
∙ Priority Decision Submission Ends 15 July
∙ Extended Submission Ends  19 Sept
∙ FastTrack Conference Proceedings Manuscripts Due 25 Dec 
∙ All Outstanding Proceedings Manuscripts Due
 6 Feb 2023
Registration Opens 1 Dec
Demonstration Applications Due 19 Dec
Early Registration Ends 18 Dec


2023
Hotel Reservation Deadline 6 Jan
Symposium begins
15 Jan


Partners






Electronic Imaging 2023

Camera Noise Sources and its Characterization Using Int'l St

SC20

Camera Noise Sources and its Characterization Using International Standards
Instructors: Uwe Artmann, Image Engineering GmbH & Co. KG and Kevin J. Matherson, Microsoft Corp.
Level: Intermediate
Duration: 2 hours
Course Date/Time: Monday 16 January 10:45 - 12:45

Benefits:
This course enables the attendee to:

  • Understand pixels and their impact on SNR, HDR, and Visual Noise.
  • Become familiar with basic noise source in mobile and digital imaging devices.
  • Learn how image processing impacts noise sources in digital imaging devices.
  • Make noise measurements based on international standards: EMVA 1288, ISO 14524, ISO 15739, IEEE-P2020, visual noise measurements, and the 3D noise model.
  • Describe simple test setups for measuring noise based on international standards.
  • Predict system level camera performance using international standards.
  • Understand applications.

Course Description:
This course provides an overview of noise sources associated with "light in to byte out" in digital and mobile imaging cameras. The course discusses common noise sources in imaging devices, the influence of image processing on these noise sources, the use of international standards for noise characterization, and simple hardware test setups for characterizing noise.

Intended Audience:
People involved in the design and image quality of digital cameras, mobile cameras, and scanners. Technical staff of manufacturers, managers of digital imaging projects, as well as journalists and students studying image technology.

Uwe Artmann studied photo technology at the University of Applied Sciences in Cologne following an apprenticeship as a photographer and finished with the German 'Diploma Engineer'. He is now the CTO at Image Engineering, an independent test lab for imaging devices and manufacturer of all kinds of test equipment for these devices. His special interest is the influence of noise reduction on image quality and MTF measurement in general.

Kevin Matherson is a director of optical engineering at Microsoft Corporation working on advanced optical technologies for AR/VR, machine vision, and consumer products. Prior to Microsoft, he participated in the design and development of compact cameras at HP and has more than 15 years of experience developing miniature cameras for consumer products. His primary research interests focus on sensor characterization, optical system design and analysis, and the optimization of camera image quality. Matherson holds a Masters and PhD in optical sciences from the University of Arizona.

 

 

Until 25 December

Starting 26 December

Member

$ 195

$ 245

Non-member

$ 220

$ 270

Student

$ 70

$ 95

 

Discounts given for multiple classes. See Registration Page for details to register.

For office use only:

Category
2. Short Courses
Track
Camera / Sensors / Calibration
When
1/16/2023 10:45 AM - 12:45 PM
Eastern Standard Time