Journal of Electronic Imaging
Objective and Content
The Journal of Electronic Imaging is co-published by IS&T and SPIE was developed in response to the significant activity and projected growth in the field and is an outgrowth of the annual Electronic Imaging Science and Technology Symposium.
The Journal of Electronic Imaging publishes papers in all technology areas that make up the field of electronic imaging and are normally considered in the design, engineering, and applications of electronic imaging systems.
Contributed papers cover the following research areas that apply directly to electronic imaging or focus on applied electronic imaging technology:
- Image acquisition
- Hard copy output
- Image data storage
- Image visualization
- Image data communication
- Image processing
- Electronic imaging applications
In addition to technical papers, the Journal also publishes book reviews and Letters to the Editor.
To purchase individual articles from JEI, go to http://jelectronicimaging.org//.
Paper Submissions
Original manuscripts not previously published and not currently submitted for publication elsewhere may be submitted for peer-review. Details can be found at http://spie.org/x85038.xml.
Institutional Subscriptions
Institutional Subscriptions are processed via our co-publisher, SPIE. Details at SPIE.
Institutional Subscription Rates 
Individual Subscriptions
IS&T members receive an online subscription to JIST or JEI with their membership. They may purchase a hardcopy or additional online subscription to either journal as detailed below:
- Add on hardcopy JEI subscription: $75
- Additional online subscription (to JEI): $75
If you are having difficulty accessing your JEI subscription, or for more information, contact [email protected].
Editorial Board
Editor-in-Chief
Zeev Zalevsky, Bar-Ilan University (Israel)
Managing Editor
Gwen Weerts, SPIE (US)
[email protected]
Senior Editors
Jenny Benois-Pineau, University of Bordeaux, (France)
Laura Boucheron, New Mexico State University, (US)
Alexander C. Loui, Rochester Institute of Technology, (US)
Stuart Perry, University of Technology Sydney, (Australia)
Gianni Ramponi, University of Trieste, (Italy)
Associate Editors
Sos Agaian, College of Staten Island (US)
Moulay Akhloufi, Université de Moncton (Canada)
Sana Alamgeer, Texas State University (US)
Mekides Assefa Abebe, Rochester Institute of Technology (US)
Sebastiano Battiato, University of Catania (Italy)
Yevgeny Beiderman, Holon Institute of Technology (Israel)
Honghua Chen, Nanyang Technological University (Singapore)
Peng Chen, RIKEN Center for Computational Science (Japan)
Ravindranath C. Cherukuri, CHRIST (Deemed to be University) (India)
Stelvio Cimato, Università degli studi di Milano (Italy)
Peter Corcoran, National University of Ireland Galway (Ireland)
Ethan Fetaya, Bar-Ilan University (Israel)
Iuri Frosio, NVIDIA (US)
Harsh Gaonkar, Google (US)
Qiuping Jiang, Ningbo University (China)
Yi Jin, Beijing Jiaotong University (China)
Igor Jovancevic, University of Montenegro (Montenegro)
Rajeev Kumar, Delhi Technological University (India)
Guoyu Lu, Rochester Institute of Technology (US)
Vladimir Lukin, National Aerospace University (Ukraine)
Andy J. Ma, Sun Yat-sen University (China)
Benjamin Milgrom, Jerusalem College of Technology (Israel)
Jean-José Orteu, Universite de Toulouse, IMT Mines Albi, Institut Clement Ader (France)
Gang Pan, Tianjin University (China)
Flavio Piccoli, Instituto Nazionale di Fisica Nucleare (Italy)
Chuan Qin, University of Shanghai for Science and Technology (China)
Dongwei Ren, Harbin Institute of Technology (China)
Alessandro Rizzi, Univ. degli Studi di Milano (Italy)
Ivano Ruo Berchera, Istituto Nazionale di Ricerca Metrologica (Italy)
Aditya Kumar Sahu, SRM University-AP (India)
Ming Shao, University of Massachusetts, Dartmouth (US)
Rakesh Kumar Singh, Indian Institute of Technology (BHU), (India)
Sophie Triantaphillidou, University of Westminster (UK)
Shiqian Wu, Wuhan University of Science and Technology (China)
Gongping Yang, Shandong University (China)
You Yang, Huazhong University of Science and Technology (China)
Mang Ye, Wuhan University (China)
Chai Tong Yuen, Universiti Tunku Abdul Rahman (Malaysia)
Zhongfei (Mark) Zhang, Binghamton University State University of New York (US)
Lei Zhu, Shandong Normal University (China)
Full Editorial Board List