IS&T Corporate Members

Please be advised that IS&T staff are working remotely, so responses may be delayed.

Archiving 2020 will be offered as a Virtual Conference this year.

The revised short course and technical program, as well as registration details, will be posted around April 15.
Details will be posted on the conference webpage as they are finalized.


Short Course Program: May 11 - 15, 2020
Technical Papers Program: May 18 - 21, 2020


 
Tentatively 30 September - 1 October 2020  /  London, UK
 
TECHNICAL PROGRAM / CALL FOR "WORK-IN-PROGRESS" POSTERS
PLEASE NOTE: The new TENTATIVE dates for this meeting are 30 September - 1 October, to be confirmed around June 1.
As details become available and are confirmed, they will be posted on the conference webpage.



 

PLEASE NOTE: At this time, planning for Print4Fab and CIC are progressing under the assumption that
Covid-19 will be contained by the date of these meetings and that they will take place in Chiba, 2-6 November
.
See conference webpage for additional information.




CIC28 2-6 November, 2020, Makuhari Messe, Chiba, Japan
(in cooperation with Printing for Fabrication 2020) 

PLEASE NOTE: At this time, planning for Print4Fab and CIC are progressing under the assumption that
Covid-19 will be contained by the date of these meetings and that they will take place in Chiba, 2-6 November
.
See conference webpage for additional information.

Journal of Imaging Science and Technology

Call for Special Issue Proposals 

An invaluable avenue for JIST to concentrate on contemporary emerging or innovative research subjects within the purview of imaging technologies is to publish high impact special issues focusing on a selected topic with thorough theoretical analyses and empirical treatments. Therefore, JIST special issues must be motivated by a clear and convincing emphasis on a designated research topic that is timely, significant and likely to generate interest among JIST's readership, which is different from the focus of well-established JIST-First issues and special issues of annual IS&T conferences. We look forward to hearing your ideas.

>> Details  >>