Raymond C. Bowman Award

Basis of Selection

The Raymond C. Bowman Award, previously sponsored by the New York Chapter, was first awarded in 1982. The award recognizes an individual who has been instrumental in fostering, encouraging, and helping individuals of any age pursue a career in a technical/scientific area of imaging science, including the pursuit of an appropriate education.

Eligibility

Both members and non-members are eligible; the recipient need not be an educator, as others work diligently to foster growth in our industry. This award recognizes these efforts.

Frequency of Award

Not more than one per year.

Form of Award

An engraved plaque is given to recipients of this award.

Past Recipients

  • 2021 Gaurav Sharma
  • 2020 Norimichi Tsumura
  • 2019 Graham Finlayson
  • 2018 Sabine Süsstrunk
  • 2017 Jon Y. Hardeberg
  • 2016 C.-C. Jay Kuo
  • 2013 Jussi Parkkinen
  • 2012 Loren Winters
  • 2011 Scott Williams
  • 2010 Gerald A. Domoto
  • 2009 Giordano Beretta
  • 2008 Mark D. Fairchild
  • 2007 Hiroaki Kotera
  • 2006 Roy S. Berns
  • 2005 Russell Kraus
  • 2004 Ralph E. Jacobson
  • 2003 Charles A. Bouman
  • 2001 Edward J. Delp
  • 1999 Jeff B. Pelz
  • 1998 Jan P. Allebach
  • 1997 Roger Easton
  • 1996 Jonathan S. Arney
  • 1994 Yasusuke Takahashi
  • 1993 Leslie Stroebel
  • 1992 Michael E. Leary
  • 1991 Soichi Kubo
  • 1990 Andrew Davidhazy
  • 1988 Xin-Min Ren
  • 1987 Arnost Reiser
  • 1986 Thomas Howard James
  • 1985 Sakda Siripant
  • 1984 George R. Bird
  • 1983 Ronald Francis
  • 1982 Burt H. Carroll