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ISO/TC 42 Plenary


ISO/TC42 holds a plenary meeting every two years. Delegations to attend the ISO/TC42 Plenary meetings are arranged through the national ISO/TC 42 member bodies. In the US, membership in an ISO/TC42 US TAG Imaging Technology (IT) Committee provides eligibility to participate in the international ISO/TC42 meetings.



26th Plenary Meeting - 2019

The ISO/TC 42 Plenary and ISO/TC 42/WG meetings are hosted by Instituto Português da Qualidade (IPQ), Universidade Lusófona, and IS&T. They take place 1317 May 2019, in Edificio U (Building U), at Universidade Lusófona, Campo Grande 388, 1749-024 Lisboa, Portugal. (See below for location of Edificio U.)

Those interested in joining the work of ISO/TC 42 and becoming a part of the US delegation should fill out a membership application.

Individuals from other countries should reach out to their ISO National Member Body for more information on joining ISO/TC 42.

The closest hotel is Radisson Blu Hotel Lisbon. Refer to N6830 below for hotel details.

Members of ISO/TC 42 should refer to the following documents for further information:  NOTE: See the registration details for the social events in N6866.

The following working groups plan to meet in conjunction with the plenary:

  • WG 3 - Image measurement, viewing, and sensitometry
  • WG 5 - Physical properties and image permanence of imaging materials
  • WG 8 - Imaging materials – Dimensions
  • WG 18 - Electronic still picture imaging
  • JWG 20 - Digital still cameras
  • JWG 23 - Extended colour encodings for digital image storage, manipulation, and exchange
  • JWG 26 - Imaging system capability qualification for archival recording and approval
  • JWG 27 -Image permanence & durability test methods and specifications for digital prints in commercial applications


25th Plenary Meeting - 2017

The The ISO/TC 42 Plenary meeting was sponsored by Intel and IS&T and was held June 5-9, 2017, at the Intel Corporation's Mission Campus in Santa Clara, California, United States.

ISO/TC 42 expresses its appreciation to the American National Standards Institute (ANSI), the U.S. Mirror Committee, the Society for Imaging Science and Technology (IS&T) and the Intel Corporation for hosting this meeting in Santa Clara and for arranging the excellent meeting facilities.

More than 50 experts from 8 of the 15 P-members attended the 25th Plenary meeting. The experts included representatives from:

  • Australia (SA)
  • Belgium (NBN)
  • Germany (DIN)
  • Japan (JISC)
  • Netherlands (NEN)
  • Switzerland (SNV)
  • United Kingdom (BSI)
  • United States (ANSI)

The following working groups plan to meet in conjunction with the plenary:

  • WG 3 - Image measurement, viewing, and sensitometry
  • WG 5 - Physical properties and image permanence of imaging materials
  • WG 8 - Imaging materials – Dimensions
  • WG 18 - Electronic still picture imaging
  • JWG 20 - Digital still cameras
  • JWG 23 - Extended colour encodings for digital image storage, manipulation, and exchange
  • JWG 25 - Use of XMP for digital photography
  • JWG 27 -Image permanence & durability test methods and specifications for digital prints in commercial applications


24th Plenary Meeting - 2015

The ISO/TC 42 Plenary meeting was held June 2-5, 2015, at the Sapporo Convention Center in Sapporo, Japan. Sapporo is the fourth largest city in Japan by population, and the largest city on the northern Japanese Island of Hokkaido.

IS&T and ISO/TC 42 express a warm thank you and appreciation to the Japanese Industrial Standards Committee (JISC) and the Photo Sensitized Materials Manufacturer's Association (PMMA) for hosting the ISO/TC 42 2015 Plenary and Working Group meetings in Sapporo and for the excellent meeting facilities. IS&T and ISO/TC 42 are also grateful to JISC and PMMA for arranging the enjoyable tour and reception at the Sapporo Beer Factory.

More than 50 experts from 9 of the 15 P-members attended the 24th Plenary meeting. The experts included representatives from:

  • Australia (SA)
  • Belgium (NBN)
  • Denmark (DS)
  • Germany (DIN)
  • Japan (JISC)
  • Netherlands (NEN)
  • Norway (SN)
  • United Kingdom (BSI)
  • United States (ANSI)

The following working groups held meetings in conjunction with the plenary:

  • WG 3 - Sensitometry, image measurement, and viewing
  • WG 5 - Physical properties and image permanence of imaging materials
  • WG 8 - Photographic film and paper products – Dimensions
  • WG 18 - Electronic still picture imaging
  • JWG 20 - Colour characterization of digital still cameras
  • JWG 23 - Extended colour encodings
  • JWG 25 - Use of XMP for digital photography
  • JWG 26 - Imaging system capability qualification for archival recording and approval


23rd Plenary Meeting - 2013

The ISO/TC 42 Plenary meeting was held June 3-7, 2013, at the National Museum of Denmark in Copenhagen. Denmark's largest museum of cultural history, the National Museum of Denmark is located in a classical 18th century mansion near the center of Copenhagen, making it easily accessible for meeting attendees.

IS&T and ISO/TC 42 express a warm thank you and appreciation to the Danish Standards Foundation (DS) and the National Museum of Denmark for hosting the ISO/TC 42 2013 Plenary and Working Group meetings in Copenhagen and for the excellent meeting facilities. IS&T and ISO/TC 42 are grateful as well to the School of Conservation Library and the National  Museum of Photography at the Royal Library for most enjoyably hosting our Secretariat and Host receptions. 

More than 50 experts from 10 of the 15 P-members attended the 23rd Plenary meeting. The experts included representatives from:

  • Australia (SA)
  • Belgium (NBN)
  • Denmark (DS)
  • France (AFNOR)
  • Germany (DIN)
  • Japan (JISC)
  • Netherlands (NEN)
  • Sweden (SIS)
  • United Kingdom (BSI)
  • United States (ANSI)

The following working groups held meetings in conjunction with the plenary:

  • WG 3 - Sensitometry, image measurement, and viewing
  • WG 5 - Physical properties and image permanence of imaging materials
  • WG 8 - Photographic film and paper products – Dimensions
  • WG 18 - Electronic still picture imaging
  • JWG 20 - Colour characterization of digital still cameras
  • JWG 23 - Extended colour encodings
  • JWG 25 - Use of XMP for digital photography
  • JWG 26 - Imaging system capability qualification for archival recording and approval


22nd Plenary Meeting - 2011

The 22nd Plenary was held June 6-10, 2011 at Rochester Institute of Technology (RIT) in Rochester, New York USA. IS&T and ISO/TC 42 appreciate RIT and the Eastman Kodak Company for hosting the ISO/TC 42 2011 Plenary and Working Group meetings in Rochester and for the excellent meeting facilities. In conjunction with the facilities, RIT hosted a luncheon and provided demonstrations of their imaging related research.

IS&T and ISO/TC 42 are grateful as well to the Eastman Kodak Company for sponsoring the Host Reception at the George Eastman House. The reception included special tours of the technology collection and music by the Saelig Trio, who was joined by a special guest soloist from Japan. 

The IS&T Standards Management Board (SMB) sponsored an evening reception enjoyed by all, with catering by Dinosaur Bar-B-Cue and country music by Cash Back

More than 60 experts from 9 of the 11 P-members attended the 22nd plenary meeting. The experts included representatives from:

  • Belgium (NBN)
  • Denmark (DS)
  • Germany (DIN)
  • Japan (JISC)
  • Republic of Korea (KATS)
  • Sweden (SIS)
  • Switzerland (SNV)
  • United Kingdom (BSI)
  • USA (ANSI)

The following working groups held meetings in conjunction with the plenary:

  • WG3 - Sensitometry, image measurement, and viewing
  • WG5 - Physical properties and image permanence of imaging materials
  • WG18 - Electronic still picture imaging
  • JWG20 - Colour characterization of digital still cameras
  • JWG22 - Colour measurement and management
  • JWG 23 - Extended colour encodings
  • JWG25 - Use of XMP for digital photography


Printing for Fabrication
2019

September 29 - October 2, 2019
San Francisco, California

CIC27 2019
October 21 - October 25, 2019

Paris, France

Electronic Imaging 2020
January 26-January 30, 2020
SFO Hyatt Regency Burlingame
Burlingame, California