Updated for 2021
Resolution in Mobile Imaging Devices: Concepts and Measurement
Instructors: Uwe Artmann, Image Engineering GmbH & Co. KG, and Kevin J. Matherson, Microsoft Corporation
Level: Intermediate
Duration: 2 Hours plus 15-minute break and 30-minute post-class discussion
Course Time:
    New York: Wednesday 13 January, 10:00 – 12:15
    Paris: Wednesday 13 January, 16:00 – 18:15
    Tokyo: Thursday 14 January, 00:00 – 02:15

Benefits
This course enables the attendee to:

• Understand terminology used to describe resolution of electronic imaging devices.
• Learn the differences between and use of object space and image space resolution.
• Understand the factors impacting the resolving power of cameras in object space.
• Understand spatial information capacity of an imaging system.
• Learn the impact of scaling camera components on resolution (sensor format, lens, number of pixels, etc.).
• Describe the basic methods of measuring resolution in electronic imaging devices and their uses, as well as pros and cons.
• Understand point spread function and modulation transfer function.
• Learn slanted edge spatial frequency response (SFR).
• Learn Siemens Star SFR.
• Understand contrast transfer function.
• Describe the impact of image processing functions on spatial resolution.
• Understand practical issues associated with resolution measurements.
• Understand targets, lighting, and measurement set up.
• Differentiation of system, lens, and sensor resolution.
• Appreciate RAW vs. processed image resolution measurements.
• Learn cascade properties of resolution measurements.
• Understand the practical considerations when measuring real lenses.
• Specify center versus corner resolution.
• Learn about impact of actuator tilt.
• Learn about impact of field curvature.
• Understand through-focus MTF.

Resolution is often used to describe image quality of electronic imaging systems. Components of an imaging system such as lenses, sensors, and image processing impact the overall resolution and image quality achieved in devices such as digital and mobile phone cameras. While image processing can in some cases improve the resolution of an electronic camera, it can also introduce artifacts as well. This course is an overview of spatial resolution methods used to evaluate electronic imaging devices and the impact of image processing on the final system resolution. The course covers the basics of resolution and impacts of image processing, international standards used for the evaluation of spatial resolution, and practical aspects of measuring resolution in electronic imaging devices such as target choice, lighting, sensor resolution, and proper measurement techniques.

Intended Audience
Managers, engineers, and technicians involved in the design and evaluation of image quality of electronic cameras (regardless of application), video cameras, and scanners. Technical staff of manufacturers, managers of digital imaging projects, as well as journalists and students studying image technology.

Uwe Artmann studied photo technology at the University of Applied Sciences in Cologne following an apprenticeship as a photographer and finished with the German 'Diploma Engineer'. He is now the CTO at Image Engineering, an independent test lab for imaging devices and manufacturer of all kinds of test equipment for these devices. His special interest is the influence of noise reduction on image quality and MTF measurement in general.

Kevin Matherson is a director of optical engineering at Microsoft Corporation working on advanced optical technologies for AR/VR, machine vision, and consumer products. Prior to Microsoft, he participated in the design and development of compact cameras at HP and has more than 15 years of experience developing miniature cameras for consumer products. His primary research interests focus on sensor characterization, optical system design and analysis, and the optimization of camera image quality. Matherson holds a Masters and PhD in optical sciences from the University of Arizona.

COST

Discounts given for multiple classes. See Registration page for details and to register.

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