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  28 January - 1 February, 2018 • Burlingame, California USA

Call for Papers

3D Image Processing, Measurement (3DIPM), and Applications 2018

Conference Keywords:  3D/4D Scanning, 3D/4D Data Processing and Filtering, 3D Shape Indexing and Retrieval, 3D Compression and Encryption, 3D Scene Reconstruction and Modeling

See Overview and Topics tabs for details on technical content and solicited topics.


  • Best Paper Award
  • Best Student Paper Award

Submission Requirements

We request that the following questions be specifically addressed in the structured abstract.
  1. What is the scientific topic or problem addressed?
  2. What are the challenges and barriers faced?
  3. Why is this important for the 3D community?
  4. What is the original method proposed to address the problem or issue?
  5. What is its novelty compared to the state of art?
  6. What is the efficiency of the method (presentation of results and comparison with the state of art)?
If the submission does not respect this format (all 6 points explicitly addressed and include some preliminary results shown), it will not be reviewed by the Program Committee.

Proposed Joint Sessions

  • Stereoscopic Image Processing and Depth Mapping with the Stereoscopic Displays and Applications Conference
  • 3D Scene Sensing and Object Recording with the Image Processing: Algorithms and Systems Conference
  • Image Sensors and Systems for 3D Imaging with the Image Sensors and Imaging Systems Conference
  • Watermarking of 3D Images / 3D Protection with the Media Watermarking, Security, and Forensics Conference

Ways to Submit

There are two options for submission; please read the descriptions carefully.  Note: This conference DOES NOT accept submissions designated for presentation-only. 

  1. Presentation at the conference and publication in the conference proceedings. This is the most common option, and if accepted may be assigned either an oral or interactive (poster) presentation. Submit a 4-6 page draft proceedings paper with optional figures using the symposium template  
  2. JIST-first. Expedited review and publication in the Journal of Imaging Science and Technology (JIST) before the conference, oral presentation at the conference, and inclusion in the conference proceedings. To meet the publication timeline, successful JIST-first submissions must require only minor revisions in response to peer-review. Those not meeting this stringent standard are automatically re-considered for presentation at the conference and publication in the proceedings (option 1 above). Author instructions for journal submissions  

Final Manuscript Deadline

The final manuscript is due 20 November 2017 for onsite proceedings.

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Important Dates
Call for Papers Announced 1 Mar 2017
Review Abstracts Due (refer to For Authors page)
· Regular Submission Ends 15 Aug 2017
· Late Submission Ends  31 Aug 2017
Registration Opens
2 Oct 2017
Hotel Reservation Deadline
5 Jan 2018
Early Registration Ends 8 Jan 2018
Conference Starts 28 Jan 2018 

View 2017 Proceedings
View 2016 Proceedings
Conference Chairs
William Puech, Laboratory d’Informatique de Robotique et de Microelectronique de Montpellier (France); Robert Sitnik, Warsaw University of Technology (Poland)

Program Committee
Atilla Baskurt, University de Lyon (France); Hugues Benoit-Cattin, Institut National des Sciences Appliquées de Lyon (France); Silvia Biasotti, Consiglio Nazionale delle Ricerche (Italy); Adrian Bors, The University of York (United Kingdom); Saida Bouakaz, University Claude Bernard Lyon 1 (France); Mohamed Daoudi, Télécom Lille 1 (France); Florent Dupont, University Claude Bernard Lyon 1 (France); Gilles Gesquière, Laboratory des Sciences de l'Information et des Systèmes (France); Afzal Godil, National Institute of Standards and Technology (United States); Serge Miguet, University Lumière Lyon 2 (France); Eric Paquet, National Research Council Canada (Canada); Frédéric Payan, University of Nice Sophia Antipolis - I3S Laboratory, CNRS (France); Frédéric Truchetet, Universite de Bourgogne (France); Stefano Tubaro, Politecnico di Milano (Italy)