CIC18 Preliminary Program Released We've got an amazing week planned for Nov. 8-12 in San Antonio, Texas, including a riverboat tour of the famous River Walk. There are a number of new short courses offered, three interesting keynotes planned, an evening talk on color holography, and a panel on educating future color imaging scientists and engineers.
Archiving 2011 Call Released Salt Lake City hosts Archiving 2011, May 16 to 19. General Chairs Wayne Metcalfe, FamilySearch, and Kate Zwaard, US Government Printing Office, have released the Call for Papers, with an October 17, 2010 submission deadline.
NIP26/Digital Fab 2010 EARLY REGISTRATION DEADLINE APPROACHING Austin, Texas hosts this year's conference, Sept. 19-23. The early registration deadline is Aug. 22nd.
NIP/DF Hotel Registration Deadline: August 30th Single/Double rate is $184/night. PLEASE NOTE: There are many conferences in town over the NIP/DF dates and we've been warned that many hotels will be selling out, so please book your hotel room now.
Fourier Methods for Imaging by Roger Easton is available now for $120 including shipping anywhere in the world. The book won't be available from Amazon until July 20th! Be among the first to get it by ordering it here.
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SPECIAL PRICE for ICC Profiles Book Color Management: Understanding and Using ICC Profiles by Phil Green, editor, has just been released as the newest in the IS&T/Wiley Series. We're offering it at low price of $85 including shipping for IS&T/ICC/SID/SPIE and ISCC-Member Body members. To take advantage of this, fax in the PDF order form.
2010 Honors and Award Recipients Announced David McDowell has been named Honorary Member of IS&T and Zhigang Fan, Graham Finlayson, and Stephen J. Simske have been named Fellows. Click on the link below to see which of your colleagues has been bestowed with a 2010 IS&T Honor or Award.
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Charlie M. Mao and Alex Ozerov, Research Laboratories of Australia (Australia)
The pen-offset method has also been used to assess fixing quality. In this technique a print is placed face down on a piece of blank paper, and a pen used to write on the back of the image. The fixing quality is judged by visually inspecting the offset image on the blank paper. The test result strongly depends on applied force and on the evaluator’s experience.
The authors have recognised the benefits of the pen-offset method, particularly its ability to assess both adhesion and cohesion strength simultaneously. They have developed a pen-offset apparatus, which can apply a constant pressure while writing on the back of the image. An image-processing module has also been developed and compiled into open source code software to evaluate the pen-offset image. The method produces reliable and reproducible results, and reduces the assessment time.
This paper will introduce the new pen-offset apparatus and the methodology for image analysis using a newly developed image processing software.
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Non-members: $12.00