EI2019 Short Course Description


SC16: Camera Noise Sources and its Characterization Using International Standards
Monday 14 January • 8:30 – 10:30 am
Course Level: Introductory/Intermediate
Course Length: 2 hours
Instructors: Kevin J. Matherson, Microsoft Corporation, and Uwe Artmann, Image Engineering GmbH & Co. KG
Fee*: Member: $185 / Non-member: $210 / Student: $65 
*after December 18, 2018, members / non-members prices increase by $50, student price increases by $20 

This short course provides an overview of noise sources associated with “light in to byte out” in digital and mobile imaging cameras. The course discusses common noise sources in imaging devices, the influence of image processing on these noise sources, the use of international standards for noise characterization, and simple hardware test setups for characterizing noise.

Learning Outcomes
  • Become familiar with basic noise source in mobile and digital imaging devices.
  • Learn how image processing impacts noise sources in digital imaging devices.
  • Make noise measurements based on international standards: EMVA 1288, ISO 14524, ISO 15739, and visual noise measurements.
  • Describe simple test setups for measuring noise based on international standards.
  • Predict system level camera performance using international standards.

Intended Audience
People involved in the design and image quality of digital cameras, mobile cameras, and scanners would benefit from participation. Technical staff of manufacturers, managers of digital imaging projects, as well as journalists and students studying image technology are among the intended audience.

Kevin J. Matherson is a director of optical engineering at Microsoft Corporation working on advanced optical technologies for consumer products. Prior to Microsoft, he participated in the design and development of compact cameras at HP and has more than 15 years of experience developing miniature cameras for consumer products. His primary research interests focus on sensor characterization, optical system design and analysis, and the optimization of camera image quality. Matherson holds a masters and PhD in optical sciences from the University of Arizona.

Uwe Artmann studied photo technology at the University of Applied Sciences in Cologne following an apprenticeship as a photographer, and finished with the German 'Diploma Engineer'. He is now CTO at Image Engineering, an independent test lab for imaging devices and manufacturer of all kinds of test equipment for these devices. His special interest is the influence of noise reduction on image quality and MTF measurement in general.

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Important Dates
Call for Papers Announced 1 Mar 2018
Journal-first Submissions Due 30 Jun 2018
Abstract Submission Site Opens 1 May 2018
Review Abstracts Due (refer to For Authors page
 · Early Decision Ends 30 Jun 2018
· Regular Submission Ends 8 Sept 2018
· Extended Submission Ends 25 Sept 2018
 Final Manuscript Deadlines  
 · Fast Track Manuscripts Due 14 Nov 2018 
 · Final Manuscripts Due 1 Feb 2019 
Registration Opens 23 Oct 2018
Early Registration Ends 18 Dec 2018
Hotel Reservation Deadline 21 Dec 2018
Conference Begins 13 Jan 2019